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09.09.2019
A. Neidel, M. Giller, T. Ullrich and S. Wallich

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A. Neidel, M. Giller, T. Ullrich, and S. Wallich (2019). Computed Tomography Meets Failure Analysis – XCT, the Failure Analyst's Darling. Practical Metallography: Vol. 56, No. 9, pp. 544-555. © Carl Hanser Verlag GmbH & Co. KG ISSN 0032-678X

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