PM Artikel
28.02.2025

 Z. Wu , J. Li, J. Zhang und S. Stücklin

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Wu, Z., Li, J., Zhang, J. and Stücklin, S.. "Deep learning in metallography: adapting a grain size determination model to develop the new comparison charts for ISO 643" Practical Metallography, vol. 62, no. 3, 2025, pp. 176-194. https://doi.org/10.1515/pm-2025-0012 © 2023 Walter de Gruyter GmbH, Berlin/Boston, Germany

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Practical Metallography, vol. 62, no. 3, 2025, pp. 176-194.

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