PM Artikel
10.07.2023
M. Sommerauer , M. Siller , H. Clemens und V. Maier-Kiener

Zitieren Sie diesen Artikel

Sommerauer, M., Siller, M., Clemens, H. and Maier-Kiener, V.. "A comprehensive study on the metallographic preparation of W-Re samples for high resolution electron-based microscopy" Practical Metallography, vol. 60, no. 3, 2023, pp. 171-186. https://doi.org/10.1515/pm-2022-1037 © 2023 Walter de Gruyter GmbH, Berlin/Boston, Germany

© 2026