This work aims to demonstrate that by obtaining a time- and frequency-resolved intensity distribution, these challenges can be overcome and distinguished acoustic patterns of defects and random interference can be analysed. To gain an understanding of the acoustic emission profiles that occur during deposition and to set up thresholds for automated defect detection, two types of samples are fabricated and monitored using enhanced AET: near defect-free references and samples that crack during processing. The recorded intensity distributions are analysed to identify possible cracks. Samples are further investigated using µ-focus computer tomography to confirm the presence of defects and ensure the quality of the reference. A correlation between defect size, acoustic profile, and crack location can be made to evaluate the suitability of in situ AET for quality control.