Poster
Two Microscopes are better than One - Nanoscale Correlative Analysis of hard to reach sample areas by combination of AFM and SEM
Stühn, L. (Speaker)¹; Alemansour, H.²; Alipour, A.²; Amann, A.²; Arat, K.²; Frerichs, H.¹; Gardiner, J.²; Jangid, D.¹; Montes, L.²; Neils, W.²; Schwalb, C.¹; Seibert, S.¹; Spagna, S.²; Wolff, M.¹
MSE 2024