Critical components made of directionally solidified Ni-base superalloy single crystals (SXs) are often designed on the basis of tensile creep data obtained for nominal <100> tensile loading directions. During directional solidification, the <100> direction is a natural growth direction. During solidification, this targeted direction is established, however, angular deviations of up to 15° can occur. The present study investigates how 15° deviations from the targeted <100> direction towards <110> and <111> affect creep strength. Creep is investigated using a procedure which combines crystallographic orientation (Laue method), miniature tensile creep testing and transmission electron microscopy (TEM). The investigation focusses on the SX ERBO/1 (CMSX-4 type) which is tested in the low temperature (1023 K) and high stress (800 MPa) creep regime.