For scientists and engineers working on the analysis of microstructures, image analysis serves as a vital tool for gaining deeper insights into complex phenomena. Whether studying grains, inclusions, particles, welds or phases, the ability to extract quantitative data from images is invaluable. Image analysis enables engineers and researchers to replace manual analysis and increase productivity, to gain additional data insights and improve statistics, and to advance their work by solving complex problems. By harnessing the power of image analysis, scientists and engineers can accelerate research, optimize manufacturing processes, and improve performance of products across a wide range of fields, ultimately advancing our understanding of the natural world and improving technology. 

Using deep learning and powerful image analysis engines, MIPAR (www.mipar.us) allows users to perform a fast, accurate and automated analysis of images. Through a user-friendly interface, engineers and researchers can personalize analysis to their samples as well as visualize and extract measurements - all without programming. Through five integrated applications, MIPAR offers flexibility and efficiency for 2D and 3D analysis applications. The key ingredients are in the Recipes, which include a series of analysis steps that are tailored to each application. As a result, researchers and engineers can now easily solve problems such as grain size analysis excluding the twins, particle analysis of clusters, defect identification and many more. Seamlessly integrated within the MIPAR ecosystem, the Snap tool, powered by Spotlight, offers accelerated creation of training datasets for an efficient and streamlined model training workflow. The accurate segmentations provided by Spotlight allow for less time spent creating models and algorithms, leading to faster data collection. MIPAR Spotlight simplifies image analysis even further by limiting the need for custom model configurations and amplifying a model’s ability. 

This presentation will overview the advantages of using MIPAR Spotlight, the new cutting edge of detection, to analyse grains, particles, defects, layer thickness and inclusions with real industrial applications