Electron backscatter diffraction (EBSD) method is widely used to determine local misorientations of crystalline specimens by determining orientations of each point on a regular grid. The orientation information is obtained by analyzing the respective Kikuchi pattern and the misorientation information is obtained from relative orientation variations. However, for assessing very small orientation variations, high resolution EBSD methods are used which involve cross correlation comparisons of various Kikuchi patterns. Yet, even a single Kikuchi pattern may have an overlap of smaller misorientations which lie under the electron interaction volume. 

In this work we decipher the overlap of such misorientations in a single Kikuchi pattern and use a robust matrix factorization method to deconvolute underlying constitutive patterns. This deconvolution then allows us to observe small changes in misorientation/curvature over the region of interest an correlate them with dislocation density. The method is first tested on dynamically simulated Kikuchi patterns to test its resolution limit. Furthermore, we test the method on experimental data sets with low angle grain boundaries (LAGBs) for corroboration. This method is particularly feasible for analyzing regions with small misorientations such as single/bi-crystal/LAGB microstructures with applications to nano scaled specimens.