Solution processed thin films are widely used in organic and hybrid photovoltaics. The involved novel materials can have conducting or semi-conducting properties. However, the nanostructure and -morphology of these neat and blended materials are decisive for the resulting function. It is therefore highly desirable to control the molecular arrangement within such thin films. To achieve this, it is necessary to have the ability to characterize the involved nanostructure and -morphology of the involved materials. Ideally during processing in a time-resolved manner. Using examples from organic and hybrid solar cells we attempt to control structural properties by exploiting in-situ characterization. We successfully achieve the characterization of processing [1,2] and show examples of controlling structural properties in such material systems [3,4].

I show the different x-ray and spectroscopy based methods available for in-situ and multi-modal characterization within our laboratory. Furthermore, I will give insights into the challenges faced by experimentalists dealing with multi-modal measurements but also demonstrate the opportunities such correlated data sets offer.

[1] C. Schötz, C. Greve et al, Adv. Optical Mater. 9, 21, 2101161 (2021).

[2] S. Pröller  et al, Adv. Energy Mater 6, 1501580 (2016).

[3] F. Eller et al, Small, 2207537 (2023).

[4] S. Pröller, et al ACS Appl. Mater. & Interf. 12 (5), 5219 (2020).