Direct Laser Interference Patterning (DLIP) technology stands out as a one-step solution to create high-throughput periodic micro-patterns on various materials [1]. This technique is particularly effective in tailoring surface properties to desired specifications. In processes using short and ultra-short laser pulses, the quality and characteristics of the resulting patterns are significantly influenced by the interplay between the laser pulses and the unique properties of the material, as well as the selected processing parameters. In processes using short and ultra-short laser pulses, the quality and characteristics of the resulting patterns are significantly influenced by the interplay between the laser pulses and the unique properties of the material, as well as the selected processing parameters [2]. Variations in these parameters during the fabrication process can lead to inconsistencies in the quality of the produced structures. Consequently, to maintain and ensure the desired quality of these structures, it is imperative to implement in-line monitoring systems that continuously track and adjust for any deviations in the processing parameters [3].

In this work, we present a preliminary analysis using a photodiode-based plasma sensor to establish a correlation between the DLIP process parameters and the final surface quality of metallic samples. The laser texturing was facilitated by the recently developed Extended Laser Interference Patterning System (ELIPSYS®, SurFunction GmbH), equipment with a solid-state picosecond laser with a pulse duration of 12 ps, operating at 1064 nm. A photodiode-based plasma sensor was implemented together with the cross-jet to study the correlation of the sensor data and the surface topography with various laser parameters. This system proved effective in detecting fluctuations in signal intensity throughout the laser process, showcasing its potential for real-time quality assurance in the DLIP process.