Glow discharge mass spectrometry (GD-MS) allows direct elemental analysis of a solid-state material. Therefore, by using GDMS techniques, we can avoid numerous potential contaminations that plague other mass spectrometry or spectroscopic techniques relying on sample digestion. However, in glow discharge mass spectrometry, the ionization of sputtered material is dependent on the conductivity of the material and performing an analysis on a low conductivity or non-conductive material is challenging. We show the calibration process and measurement of a zirconium-based ceramic using secondary cathode and doping method of calibration. This calibration method consists of the addition of a standard solution in a pure material sharing the similar matrix than our sample. The analysis is then, performed after drying and homogenizing the prepared standard. To define the intensity of the matrix effect the results are shown by the calculated RSF of three different zircon-based matrices. Our secondary cathode is made of pure tantalum including less than 100 ppm of impurities. We developed a correction method for the blank that takes into account our blank heterogeneity and the continuous evolution of the matrix and the cathode ablation ratio during the analysis