Lecture
04.06.2025
Spatially resolved cure monitoring of SMC by electrical time-domain reflectometry
Winkler, A. (V)¹; Ehrig, T.²; Gude, M.²; Müller-Pabel, M.²; Steinbild, P.J.²; Wieja, N.²
International Conference on System-Integrated Intelligence - SysInt 2025
