Automated Crystal Orientation Mapping (ACOM-TEM) is a powerful tool for crystal orientation determination with nanometer spatial resolution. ACOM-TEM is often based on a template matching procedure, in which experimentally recorded nano-beam electron diffraction (NBED) patterns are compared to kinematically simulated ones. As electron diffraction is strongly dynamical, ACOM-TEM mostly relies on electron beam precession during acquisition to reduce dynamical effects, resulting in more accurate orientation identification. Here we explore the possibility to determine crystal orientations with high angular resolution from NBED patterns acquired without precession. In addition, we show that by using a direct electron detector, the acquisition speed can be significantly reduced. Finally, we have combined this technique with an automated strain mapping algorithm, opening the possibility to measure orientation and strain from the same dataset. Combining these two techniques can lead to great insight into deformation mechanisms at the nanoscale even in the case of polycrystalline materials or materials after severe deformation that contain both, local strain and considerable misorientations.

The authors gratefully acknowledge the financial support from the Austrian Science Fund (FWF) (Y1236-N37).