In recent years, the industry has widely adopted laser-based processes because they are faster and more automated than traditional methods. Laser technologies offer many possibilities, but their physical mechanisms are highly dependent on process conditions, and real-time monitoring and control systems are essential. Direct Laser Interference Patterning (DLIP) is an innovative solution for efficient high-speed surface patterning by transferring a periodic intensity distribution to the material surface, allowing direct surface patterning of many materials.

In this work, an in-situ monitoring strategy is presented, based on photo-diodes that are used to capture different signals from the process zone, during the DLIP. The parts treated consist on a titanium alloy and were produced by additive manufacturing. These parts were previously polished by a laser treatment using CW radiation. Preliminary results showing a correlation between sensor readings and laser process parameters with sample surface quality are presented.