55. Metallographie-Tagung 2021 - Materialographie
Oral-Poster-Präsentation
29.09.2021
Combined Atom Probe/tEBSD for Grain and Phase Boundary Analysis of Coatings and Thin Films
RC

Dr. Rene Chemnitzer

CAMECA / Ametek

Chemnitzer, R. (V)¹; Chen, Y.¹; Prosa, T.¹; Rice, K.¹; Ulfig, R.¹
¹CAMECA / Ametek
Vorschau
4 Min. Untertitel (CC)

Transmission EBSD mapping offers the ability to target site-specific grain or phase boundaries for APT analysis, and correlate boundary chemistries with grain misorientations. The analysis of chemical segregation at grain boundaries is a major area of interest because of the very high spatial resolution possible with APT. Finding a grain boundary with electropolishing techniques can be time consuming and difficult, requiring repeated cycles of TEM and electropolishing. In this study we demonstrate that high-resolution transmission electron back scattering diffraction (tEBSD) maps can be acquired on needle-shaped atom probe tomography (APT) specimens that consist of grains of size ranging from few hundred nanometers to few micrometers. The use of this correlative technique will be demonstrated with thermal barrier coatings (TBCs) used in turbine engines to operate at temperatures greater than the melting temperatures of engine components and consequently achieve better propulsive power performance and fuel efficiency. The general structure consists of three layers: a top is a coat made of yttrium-stabilized ZrO2 (or YSZ), which has excellent thermal resistivity, a thermally grown oxide (TGO) scale, that consists of a-alumina grains, and a bond coat layer at the coating/substrate interface that improves adhesion of the ceramic layers on the superalloy substrate.

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